3 edition of Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry found in the catalog.
Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry
James L. Lauer
Published
1987
by National Aeronautics and Space Administration, For sale by the National Technical Information Service in [Washington, D.C.], [Springfield, Va
.
Written in English
Edition Notes
| Statement | James L. Lauer and Bruce G. Bunting and William R. Jones, Jr. |
| Series | NASA technical memorandum -- 89844. |
| Contributions | Bunting, Bruce G., Jones, William R., 1940-, United States. National Aeronautics and Space Administration. |
| The Physical Object | |
|---|---|
| Format | Microform |
| Pagination | 1 v. |
| ID Numbers | |
| Open Library | OL15282040M |
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