3 edition of Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry found in the catalog.
Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry
James L. Lauer
by National Aeronautics and Space Administration, For sale by the National Technical Information Service in [Washington, D.C.], [Springfield, Va
Written in English
|Statement||James L. Lauer and Bruce G. Bunting and William R. Jones, Jr.|
|Series||NASA technical memorandum -- 89844.|
|Contributions||Bunting, Bruce G., Jones, William R., 1940-, United States. National Aeronautics and Space Administration.|
|The Physical Object|
International trade and development, theory and policy.
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